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Michel Cathelinaud

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CNRS Research Engineer

Institut des Sciences Chimiques de Rennes UMR CNRS 6226
Université de Rennes 1
Campus de Beaulieu
35042 Rennes, France

Building 10A, Room 254
Phone: +33 (0) 2.23.23.67.55
Email: michel.cathelinaud@univ-rennes1.fr

  • Responsible of “Optic and Photonic technologic network” of CNRS 2005-2007
  • Deputy Manager of MRCT of the CNRS (DEC. n° 080041SING du 13-10-2008) 2008-2013

Education and Professional Experience

  • 1990 : DEA « Optique et traitement de l’image » Aix Marseille III
  • 2000 : « Séquences métal-diélectrique par le filtrage spectral large bande et les absorbeurs de lumière : Détermination d’indice des couches minces métalliques » Aix-Marseille III
  • 1991-2000 : LOSCM (ENSPM) URA 1120 Marseille
  • 2000-2007 : Fresnel Institute UMR 6133 Marseille
  • 2008 -2013 : MRCT & UPS 2274 Meudon
  • November 2013 -> ISCR UMR 6226 EVC Rennes

Current Themes of Research

  • Optical thin films: design, manufacturing, optical characterization by spectrophotometry, deposition methods, optical monitoring with reflectance and/or transmittance
  • Chalcogenide Ceramic-glass for energy in thin film and development of new chalcogenide films
  • Thin film Technologies: electron-beam deposition, reactive low voltage ion plating deposition, sputtering RF and DC
  • Material used:
    — Metals : Cr, Ni, Hf, Al,…
    — Dielectrics: HfO2, Ta2O5, SiO2, Na3AlF6, MgF2, ZnS,
    — Chalcogenides: Cu2GeSe3, Cu3SbSe4, Sb2Se3,…

Keywords

  • Thin films
  • Chalcogenide

Selected publications

  • Index determination of opaque and semitransparent metallic films: application to light absorbers.
    Michel Cathelinaud, Frédéric Lemarquis, and Claude Amra
    Applied Optics 2002, 41(13), 2546-2554
  • Chalcogenide coatings of Ge15Sb20S65 and Te20As30Se50.
    Virginie Nazabal, Michel Cathelinaud, Weidong Shen, Petr Nemec, Frédéric Charpentier, Hervé Lhermite, Marie-Laure Anne, Jérémie Capoulade, Fabien Grasset, Alain Moreac, Satoru Inoue, Miloslav Frumar, Jean-Luc Adam, Michel Lequime, and Claude Amra
    Applied Optics 2008, 4713), C114-C123
  • Optical modeling of organic solar cells based on CuPc and C60.
    Florent Monestier, Jean-Jacques Simon, Philippe Torchio, Ludovic Escoubas, Bernard. Ratier, Wassim Hojeij, Bruno Lucas, André Moliton, Michel Cathelinaud, Christophe Defranoux, and François Flory
    Applied Optics 2008, 47(13), C251-C256
  • Laser damage resistance of hafnia thin films deposited by electron beam deposition, reactive low voltage ion plating, and dual ion beam sputtering.
    Laurent Gallais, Jérémie Capoulade, Jean-Yves Natoli, Mireille Commandré, Michel Cathelinaud, Cian Koc, and Michel Lequime
    Applied Optics 2008, 47(13), C107-C113
  • Global sensitivity analysis of bandpass and antireflection coating manufacturing by numerical space filling designs.
    Olivier Vasseur, Michel Cathelinaud, Magalie Claeys-Bruno, and Michelle Sergent
    Applied Optics 2011, 50(9), C117-C123

Publications referenced in HAL